Samsung UE40F5000AW, BN41-01955B, HIGH_X13_eu_OS, U85B, BN41-01955A, U85B, SEMS29, F59L1G81A 1.0.0

NAND Socket x8/x16, 4xCE, 3.30V

NAND ID 92F18095407F7F7F (92F18095407F7F7F), CE1 (*)

Manufacturer ESMT92

Model name F59L1G81A

Bus and voltage x8 3.30V

Serial Access 25ns

Address Cycles 2/2 (Col/Row)

Page size 0x800 (2048)

Spare size 0x40 (64)

Pages in Block 0x40 (64)

Block data size 0x20000 (131072) 128 KiB

Block raw size 0x21000 (135168) 132 KiB

Blocks count 0x400 (1024)

Bits per Cell 1 (SLC)

ECC Requirement 1/512 (Bits/CW)

Dies per Chip 1

Chip (CE) count 1

Total data size 0x8000000 128 MiB

Total raw size 0x8400000 132 MiB

BAD blocks detection 1st spare marker byte

BAD blocks management Use Reserved Area

BAD Blocks Table main Samsung UPCH Block 0x03FD (1021)

BAD blocks request...OK

BAD blocks count: 2

Block 0x007C (124) addr 0x00F80000 (0x00FFC000) BAD Block

Block 0x03FF (1023) addr 0x07FE0000 (0x083DF000) BAD Block

Analysis on ID skipped (UDEV)

Building BBT Map, RBA Blocks 0x03FB-0x03E9 (1019-1001)...

Block 0x03FB (1019) addr 0x07F60000 (0x0835B000) RBN for block 0x7C (124)

Block 0x03FF (1023) addr 0x07FE0000 (0x083DF000) ignored

BAD Blocks Table main Samsung UPCH Block 0x03FD (1021), reading...OK

BAD blocks count: No BAD blocks!

NAND Dump, 2112 byte(s)