Информация о файле
Samsung UE40F5000AW,
Платформа HIGH_X13_eu_OS, U85B
Panel CY-HF400BGSV1H
MAIN BN41-01955A, BN41-01955B, U85B
CPU SEMS29
NAND F59L1G81A
В архиве:
24C256.bin
W25Q40CL.bin
F59L1G81A.bin
NAND Socket x8/x16, 4xCE, 3.30V
NAND ID 92F18095407F7F7F (92F18095407F7F7F), CE1 (*)
Manufacturer ESMT92
Model name F59L1G81A
Bus and voltage x8 3.30V
Serial Access 25ns
Address Cycles 2/2 (Col/Row)
Page size 0x800 (2048)
Spare size 0x40 (64)
Pages in Block 0x40 (64)
Block data size 0x20000 (131072) 128 KiB
Block raw size 0x21000 (135168) 132 KiB
Blocks count 0x400 (1024)
Bits per Cell 1 (SLC)
ECC Requirement 1/512 (Bits/CW)
Dies per Chip 1
Chip (CE) count 1
Total data size 0x8000000 128 MiB
Total raw size 0x8400000 132 MiB
BAD blocks detection 1st spare marker byte
BAD blocks management Use Reserved Area
BAD Blocks Table main Samsung UPCH Block 0x03FD (1021)
BAD blocks request...OK
BAD blocks count: 2
Block 0x007C (124) addr 0x00F80000 (0x00FFC000) BAD Block
Block 0x03FF (1023) addr 0x07FE0000 (0x083DF000) BAD Block
Analysis on ID skipped (UDEV)
Building BBT Map, RBA Blocks 0x03FB-0x03E9 (1019-1001)...
Block 0x03FB (1019) addr 0x07F60000 (0x0835B000) RBN for block 0x7C (124)
Block 0x03FF (1023) addr 0x07FE0000 (0x083DF000) ignored
BAD Blocks Table main Samsung UPCH Block 0x03FD (1021), reading...OK
BAD blocks count: No BAD blocks!
NAND Dump, 2112 byte(s)
